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  2. Hitting the Sweet Spot: Metrics Success at AT&T

Hitting the Sweet Spot: Metrics Success at AT&T

By John Cirone, Patricia Hinerman, Dorothy Rhodes

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Posted May 31, 2003 | Leadership |
Opening Statement
David Garmus

The Big Picture: Software Measurements in Large Corporations
Capers Jones

Extracting Real Value from Process Improvement
Thomas M. Cagley, Jr.
About The Author
John Cirone
Patricia Hinerman
Dorothy Rhodes
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