Article

The Latest on the Y2000 Testing Front

Posted December 31, 1998 | Leadership |

THE LATEST ON THE Y2000 TESTING FRONT

In this Executive Update, Senior Consultant Don Estes, one of the Cutter Consortium's testing experts, provides insight on some of the most current testing issues. Looking forward, he also discusses what we can learn from the Y2000 experience.

About The Author
Don Estes
Don Estes is President of Don Estes & Associates. He has served as Editor of the Cutter IT Journal and as a speaker at Cutter Summits. He has more than 35 years experience in IT, more than half of which has been focused on managing the business and technical risks in the modernization of legacy applications and their integration with new technology. His writings have brought both a theoretical and a practical view to extracting the value… Read More
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