Book Review

Posted February 29, 1996 | |

Book Review

by Ed Yourdon

Patterns of Software Systems Failure and Success

Capers Jones
Boston: International Thomson Computer
Press, 1996)
ISBN: 1-850-32804-8

About The Author
Ed Yourdon
Ed Yourdon was cofounder, with Karen Coburn, of Cutter Consortium. Ed served as Fellow of the Cutter Business Technology Council, and Founding Editor and Editor Emeritus of the Cutter IT Journal. He chaired Cutter's Summit for many years. Mr. Yourdon is widely known as the lead developer of the structured analysis/design methods of the 1970s. He was a codeveloper of the Yourdon/Whitehead method of object-oriented (OO) analysis/design and the… Read More
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