REUSE AND METRICS
6 May 1998
by Ed Yourdon
As reuse programs gain steam and application development units utilize increasing proportions of reusable components, their total productivity indexes (PIs) will increase.
Article
About The Author
Ed Yourdon was cofounder, with Karen Coburn, of Cutter Consortium. Ed served as Fellow of the Cutter Business Technology Council, and Founding Editor and Editor Emeritus of the Cutter IT Journal. He chaired Cutter's Summit for many years. Mr. Yourdon is widely known as the lead developer of the structured analysis/design methods of the 1970s. He was a codeveloper of the Yourdon/Whitehead method of object-oriented (OO) analysis/design and the… Read More
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